Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM) are available
MSL is pleased to offer standard and advanced techniques of specimen preparation and research level instruments. Please contact Kristen White before you begin your study.
- JEOL 1230 TEM
- Zeiss Supra 25 FESEM with Secondary, Backscatter, STEM and EDX detectors
All of our electron microscopes are equipped for digital imaging
Specimen preparation techniques
- Standard methods including utilization of various embedding media and negative stains.
- Immuno methods including immuno-gold and silver enhanced immuno-gold.